Scanning Electron Microscopy (SEM) is the most important analysing tool in modern materials science and engineering. In addition to high resolution images down to nanometer resolution, a modern instrument is capable of qualitative and quantitative chemical analysis, several methods for detecting phases at high accuracy, electron beam induced current mapping for semiconductor research and crystallographic information both on the nanoscale and as quantitative mapping of specimen surfaces.
SEM instruments are widespread both in academic /research institutions and at advanced industrial laboratories.
The workshop is intended both for operators of instruments and for researchers needing updated information of what modern instruments can contribute to the needs in experimental reserach of materials. Top experts from leading manufacturers will give the lectures in addition to Specialist in Image prcessing, Bente Kroka from Elkem.
Serguei Matveev, representing JEOL, graduated from Moscow State University, Faculty of Geology. Did his PhD in Germany and Australia in the field of Experimental Petrology (also geology). After postdoc in Münster (Germany) relocated and worked in Canada running laboratory for electron microanalysis for 12 years, after that for 6 years was responsible for microanalysis and SEM operation in the Netherlands until started with JEOL as an application specialist in the fields of SEM and microanalysis. Love to travel to Norway, learned more about this beautiful country after travel agency booked for him flight to Kristiansund instead of Kristiansand for his last trip to the University of Agder.
René has been working at the EDAX European support office in Tilburg, The Netherlands since 2001 as applications specialist for EBSD and later also EDS. His focus is on instrument demonstrations, conference and workshop presentations, and after-sales customer support. This includes (on-site) training courses, assistance with analytical problems, and scientific collaborations. Although focused on Europe, his work has brought him to customers and conferences all over the world. This international travel is a great bonus for his hobby geocaching where he tries logging at least one cache in every city visited.
As he has always been fascinated by the physical world around him, René has chosen to study geology at Utrecht University with specialization in materials science from a geological perspective. René’s first introduction to electron microscopy and microanalysis came during his undergraduate thesis on deformation and pressure indicators in natural fault rocks from New Zealand, which involved a significant amount of SEM and TEM work. Later during his PhD thesis on nanometer-scale melt structures in upper mantle rocks in collaboration with ANU Canberra, he also learned about high resolution TEM imaging and EDS analysis. Around this time, he also started using EBSD on a system without any automation in 1998.
Rene’s background in geology gives him a slightly different view on materials research, which has proven invaluable over the years at EDAX. In geology, one must often look at a material without any prior knowledge on how it was formed. Applying this view to man-made materials can be a great help in explaining unexpected test results or materials failures that customers need to understand.
Date : 03.12.19 – 04.12.19
Day 1: 10.30-19.00 (lunch 12:10-13:00 dinner 19:30)
Day 2: 09:00-16:10 (lunch 12:15 – 13:15)
Place: UiA, Grimstad, Norway
Capacity: 20 people
Price: 5900, - NOK
Register within: 26.11.19
Contact Person: Ann-Malene Ljøsne Hinlo // firstname.lastname@example.org // +47 908 59 299
Agenda: Workshop program